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SITAR has dedicated CMOS process line housed in class
10 clean rooms. The process line is monitored through in
line quality measures.
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SITAR promotes a Total Quality Culture – beginning with capturing the customer specifications in Customer Contract Review and ensuring delivery of defect free product to the customer. This is achieved by a clearly defined quality plan for each process and total involvement of every one in sustaining and successfully executing the quality plan. SITAR has given utmost importance to safety and environment by incorporating the same in its Quality Policy. SITAR QUALITY POLICY
The Quality Policy has been developed by top management based on the following requirements:
Top management ensures that Quality Policy is communicated to all employees. It is posted in prominent places throughout the facility to maintain high standards within the society. It is included in New Employee Orientation on the Quality Management System. As and when Quality Policy is amended, changed or revised by the top management, the same is communicated throughout the society. Quality Manual
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| Tender reference | Description of work | Tender closing date and time | Last date for collection of tender Document | Details of the tender |
| SITAR/410K064 |
Various Types of Special Wafers |
13/12/2010
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For details and specification Please contact Head - Head Contracts &Purchase Phone No: +91-80-2565 0356 Telefax No: +91-80-2565 0829 E-mail : purchase@sitarindia.com
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| SITAR/310MEMS/H006 |
SEMI-AUTOMATIC PROBER |
30.09.2010
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9/09/2010 | |
| SITAR/310MEMS/H007 |
THICKNESS MEASUREMNET SYSTEM |
30.09.2010
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9/09/2010 |
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SITAR/310MEMS/H008 |
RESISTIVITY MEASUREMENT SYSTEM |
30.09.2010
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9/09/2010 | |
| SITAR/310MEMS/H009 |
DEVICE ANALYZER
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30.09.2010
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9/09/2010 | |
SITAR/310MEMS/H010 |
ELECTRON BEAM EVAPORATION SYSTEM |
30.09.2010
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9/09/2010 | |
| SITAR/310MEMS/H011 | OPTICAL INSPECTION MICROSCOPES |
30.09.2010
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9/09/2010 | |
| SITAR/310MEMS/H013 | WET BENCHES FOR 6" SILICON WAFER PROCESSING | 30.09.2010 | 9/09/2010 | |
| SITAR/310MEMS/H014 |
OPTICAL PROFILER |
30.09.2010 | 9/09/2010 | |
| SITAR/310MEMS/H017 |
Sputtering System |
15/10/2010 |
24/09/2010 | |
| SITAR/310MEMS/I018 | Deep Reactive ION Etching system(DRIE)for silicon |
15/10/2010 |
24/09/2010 |
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| SITAR/310MEMS/I019 |
Low Pressure High Density ICP Etch System For Dielectric Materials |
15/10/2010 |
24/09/2010 |
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| SITAR/310MEMS/I020 | Wire Bonder |
15/10/2010 |
24/09/2010 |
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| SITAR/310MEMS/I021 | Wafer Bonder with IN-SITU Aligner |
15/10/2010 |
24/09/2010 |
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| SITAR/310MEMS/I022 | PECVD System for A-SI Deposition |
15/10/2010 |
24/09/2010 |
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| SITAR/310MEMS/I023 |
CVD System for Dielectric Deposition |
15/10/2010 |
24/09/2010 |
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| SITAR/310MEMS/I024 |
Mask Aligner | 15/10/2010 | 24/09/2010 | |
| SITAR/310MEMS/I025 | Wafer Track | 15/10/2010 | 24/09/2010 | |
| SITAR/210I044 | Pneumatic Testing Of Cryogenic Vessels Safety Valve &Pipe LINES |
27/09/2010 | ||
| SITAR/210I042 | Spares For 1000 KVA DDC make DG sets |
27/09/2010 | ||
| SITAR/310I004 | I-LINE WAFER STEPPER |
2/11/2010 |
14/10/2010 | |
| SITAR/510I026 | Testing Of 1000 KVA Transformer |
25/10/2010 | ||
| SITAR/MEMS/210H047 |
Supply of 12 lakh litres of Ultra High Pure Liquid Nitrogen |
8/11/2010 |
14/10/2010 |
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| SITAR/410J060 | Contamination standared for surfscan |
25/10/2010 | ||
SITAR/210J050
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Super Thick Board File with Tag in eye lids inside and with SITAR printing
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25/10/2010
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